不良研究所

Integrated Circuits and Systems

不良研究所

Wafer probe card
Wafer Probe Card- Apparatus used to probe the many electronic circuits on a single silicon wafer. - Helene Mayer

Design of integrated circuits and systems

Design of analog, digital, mixed-signal, and RF integrated circuits (ICs) in nanometer CMOS/BiCMOS technologies; ICs for signal processing and data communication; system-on-chip; MEMS and integrated microsystems.

Electronic design automation and simulation of integrated circuits and microsystems

Methodologies, algorithms, optimization, modeling, simulation.

High-speed interconnects and packaging

Interconnect modeling and simulations, signal/power integrity and EMI in electronic circuits.

Microchip
Microchip
Embedded systems

FPGAs and applications, Verification and test, Multiprocessors.

Microwave electronic circuits and components

Design of microwave electronic circuits, antennas and Electromagnetic bandgap structures.

Mixed-signal testability

Testability design for analog, mixed-signal and RF integrated circuits.

Reconfigurable computing

FPGAs in scientific computing, Application-specific computer architectures.

Signal processing microsystems

VLSI architectures for digital communications and signal processing, ASIC and FPGA implementation.

Web Site

Integrated circuits and systems group members

Integrated circuits and systems group members

Sharmistha Bhadra
Christophe Dubach




Boris Vaisband

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