不良研究所


X-Ray & Electron Microscopy


Want to visualize your samples micro-structure in 3D?
Want to characterize the material properties of your specimen on a nano-scale?

The highly advanced X-ray microscope technology of our Zeiss Xradia 520 Versa takes non-destructive three dimensional imaging to a new dimension. It allows to visualize and quantitatively measure the previously unattainable sub-micron architecture of an almost unlimited range of material, ranging from solids such as rock, glass, polymers, metals, fossils and bones to soft biological tissue.

The Hitachi TM3030PLUS Table Top Electron Microscope is a low-vacuum scanning electron microscopes (SEMs) that allow easy observation and analysis of a broad range of samples - from organic to anorganic - without specimen preparation.

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