不良研究所

SEM Consultation Form

If you are interested in a free consultation, please fill the Scanning Electron Microscope (SEM)聽form below. An IQBI staff member will contact you shortly to arrange an informal meeting that is FREE of charge.

User Information
不良研究所 Information
Affiliation Information
Please include the magnification you need and the approximate size of your sample.
ie. Cells, tissues, etc.
Critical Point Drying (CPD), coating, etc.
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